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BRUKER TRACER IV-SD HANDHELD XRF ANALYZER

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Original price was: $11,800.00.Current price is: $6,300.00.

(-47%)

The capabilities of a bench-top instrument, with the convenience of a handheld
Powerful PC based analytical software which provides live spectral display and complete peak identification
Customizable filters and secondary targets to optimize analysis

Product details

BRUKER TRACER IV-SD HANDHELD XRF ANALYZER

The Tracer IV-SD incorporate a proprietary Silicon Drift Detectors (SDD) which provide high speed data acquisition, better resolution than traditional SiPIN detectors and light element sensitivity. Ultimate light element sensitivity can be achieved when the TRACER 5i, Tracer III-SD or Tracer IV-SD is operated with the optional vacuum system.

Benefits at a glance

The capabilities of a bench-top instrument, with the convenience of a handheld
Powerful PC based analytical software which provides live spectral display and complete peak identification
Customizable filters and secondary targets to optimize analysis (TRACER 5i and Tracer III series only)
Live-time spectral display
Vacuum technology developed in partnership with NASA for the space shuttle program
A mounting bracket for a tripod to allow precise three dimensional positioning of the analyzer
Proprietary SDD technology (TRACER 5i and Tracer III-SD and IV-SD only)
Unmatched application training and support, including a network of scientists with Tracer expertise
Benchtop-like calibration and application development

BRUKER TRACER IV-SD HANDHELD XRF ANALYZER Technical Details:

Weight: 2 kg (4.49 lbs) with Batteries; 1.77 kg (3.9 lbs) base weight
Size: 30 cm(L) x 10 cm(w) x 28 cm(H)
Detector: 10 mm2 XFlash® SDD; peltier cooled; typical resolution 145 eV at 100,000 cps
X-ray tube: Rh target; max voltage 40 kV
Filter changer: 5 position computer controlled filter changer
Vacuum pump attachment: Yes. Allows for enhanced light element sensitivity
Software-driven voltage and current control: Included
Instrument stand: Included, for desktop applications

The Bruker Tracer family of XRF (X-ray fluorescence) analyzers has
become the defacto standard for art and archeology investigations
because of its unique flexibility. The Tracer family is also the preferred
choice for research or teaching. This system is unique in its flexibility
for the investigation of non-uniform substances and for training new
scientists in the field of XRF. The system can be used in the laboratory or
the field, controlled by a PC or PDA.
In art and archeology, the Tracer lends itself to a wide variety of uses such
as determining the provenance of objects of cultural value or obtaining
elemental data for geochemical survey—often a critical tool in supporting
authentication, establishing source provenance, etc.
In art conservation and restoration, elemental composition can be
determined reliably and sensitively, ensuring that an appropriate course of
treatment can be established, whether it be via finding a close match of
pigments and other materials or verifying previous conservation efforts.
Safe repatriation of cultural artifacts according to NAGPRA1
regulations is
also made possible through analysis for toxic heavy metals such as Hg,
As, and Pb that have been used to preserve objects in museum settings.
For research and teaching, the Tracer family provides the utmost in
flexibility and transparency in excitation parameters, allowing students
to learn firsthand how changing XRF excitation parameters will affect
analysis results

If you have any question, dont hesitate to contact us for question and quote.

 

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